I/V自動(dòng)曲線(xiàn)追蹤儀Auto Curve Tracer
Main?Function
Open?/Short?Test
I?/?V?Curve?tracer?Analysis
Idd?Measuring
Power?Leakage?Test
菜單
產(chǎn)品展示
Main?Function
Open?/Short?Test
I?/?V?Curve?tracer?Analysis
Idd?Measuring
Power?Leakage?Test
? On this failure analysis application, only two probe tips are need. System offers four specific channels, CH1 (F-) / CH2 (F+) / CH3 (S-) / CH4 (S+), to complete this requirement without the pin assignment definition. User can easy to find out fail pins I/V curve situation.
Pin assignment is easily set by a mouse click on the window –based
any tested pins can be selected by software as “All-Pin”, “Pin-All” and “Pin-Pin”.
User can memorize the I/V curve of one golden device and compare with the unknown devices, so it becomes very simple and quick to find out problem samples.
‘O/S Test or Leakage test item -(Unpowered)’
After executing “Test Project > New Project” menu and loading the relative pin assignment file, please execute the below menu to open “O/S & LK (Unpowered)” tab.
微信掃一掃021-34638926
Copyright © 2019, 上海儀準(zhǔn)電子科技有限公司 滬ICP備16044249號(hào)
技術(shù)支持：匯成傳媒